BRUKER Nano - DektakXT - Mechanical profilometer - 2017

Advanced tool for measuring the height of thin and thick film pitches. In addition to profiling surface topography and undulation, the DektakXT system measures roughness at the nanoscale
THE LIST OF LOTS IS NOT DEFINITIVE, IMPORTANT LOTS WILL BE ADDED LATER, PLEASE CHECK THE ADDED LOTS.

The sale includes only what appears in the photos.

The buyer, by purchasing the equipment, agrees that the device must be used according to the standards and legislation in force in his country. The seller will not be held responsible in any way for misuse that does not comply with the safety conditions and the standards and legislation in force
Auction-ID: A1-49883-255
seller offer No. resale 094ecf62-9298-42e8-b4e8-735539bd34d2