Sistemas AOI ORBOTECH Ultra Discovery VM

partes eléctricas / partes eléctricas

Fabricante: ORBOTECH

Modelo:Ultra Discovery VM

Tipo de máquina: Sistemas AOI

Número de artículo: 168185568

Cantidad: 1

Fecha: 08.12.2025

Año de fabricación: 2011

Ubicación: Munich, Germany

Precio:


Seller-item-No.:8087802

Manufacturer: Orbotech

Model: Ultra Discovery VM

Year of Manufacture: 2011

Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production.

Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time.

Benefits

- High throughput and superior detection with a minimal number of false calls
- Especially designed for inspection of the finest lines down to 10 µm
- Quick setup even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
- SIP Technology

Push-to-Scan:

- A no setup” process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full Step and Repeat” functions

Visual Intelligence:

Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you U51258834 want.

Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects.

Visual Intelligence:

- Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed

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Contact us at -
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Manufacturer: Orbotech

Model: Ultra Discovery VM

Year of Manufacture: 2011

Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BGA, PBGA, CSP, and COF production.

Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of the manufacturer’s valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized, saving precious verification time.

Benefits

- High throughput and superior detection with a minimal number of false calls
- Especially designed for inspection of the finest lines down to 10 µm
- Quick setup even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
- SIP Technology

Push-to-Scan:

- A no setup” process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full Step and Repeat” functions

Visual Intelligence:

Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP, and COF production. With the Visual Intelligence Detection Engine, now dedicated for IC substrate applications, manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you U51258834 want.

Ultra Discovery VM is U51258834 equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection, and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10 µm. The customized professional lens, featuring unique wide-angle illumination, delivers very clear images essential for capturing the finest defects.

Visual Intelligence:

- Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed

Find more here - /

Contact us at -
seller offer No. resale 8087802
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Vendedor

logo dealer

UCY Industrial GmbH

Señor Nick Breinfalk
82049 Pullach
Germany

RESALE miembro desde 2024

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