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ThermoFisher OptiFIB Taipan G2+ DualBeam FIB-SEM System Failure Analysys Equipment

2019ID 168524966

2019ID 168524966

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Technical data

· ID 168524966
Source: seller information

Machines

Condition
used
Year of manufacture
2019
Location
Portland, OR

Identifikation

ManufacturerThermoFisher
ModelOptiFIB Taipan G2+ DualBeam FIB-SEM System
Item number8343257

Technik

Quantity1

Description

Manufacturer: ThermoFisher

Model: OptiFIB Taipan G2+

Year of Manufacture: 2019

Type of Machine : DualBeam Focused Ion Beam – Scanning Electron Microscope (FIB-SEM)

Condition: Used . Excellent working and physical condition, professionally inspected

Included Items:

1. Main DualBeam FIB-SEM column and stage

2. Control console and computer with new SSD installed, fully processed and ready for operation

3. De Chemistry and DX Chemistry units as pictured

4. Complete set of basic technical documentation

Advantages of This Unit:

Premium Source – Originates from Intel fabrication environment

Modern Platform – G2+ generation offers enhanced resolution and stability for advanced nanofabrication and 3D analysis

Plug-and-Play Ready – Serviced and fitted with critical new components

Ideal For: Semiconductor failure analysis, materials science research, nano-prototyping, life sciences

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ID: 168524966

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