X RITE used machine for sale

Part No.: EO2-XR-ULZW // S. No.: 1 045042 Equipment / Additional information Technical specifications: Spectral technology: Spectral range: 380-730 nm Physical measuring interval: 3.5 nm Optical resolution: 10 nm Spectral resolution: 380 nm… 730 nm with 10 nm interval Measurement frequency in scan mode: 200 measurements / sec. Reflection measurement: spectral reflection (dimensionless) Emission measurement: spectral radiance (Mw / nm / m2 / sr), luminance (cd / m2) Ambient light measurement: spectral irradiance (mW / nm / m2), luminance (lux) measuring head for diffuse light with cosine correction

used X-Rite 528 Spectraldensitometer